Transistor with fin structure and nanosheet and fabricating method of the same
AssigneeUnited Microelectronics Corp.
InventorsChing-In Wu, Yu-Ming Lin, Cheng-Tung Huang
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AssigneeUnited Microelectronics Corp.
InventorsChing-In Wu, Yu-Ming Lin, Cheng-Tung Huang
Estimating the term…
A fabricating method for a transistor with a fin structure and a nanosheet begins by providing a first fin structure with a dummy gate, two spacers, a first embed epitaxial layer, and a second embed epitaxial layer. Subsequently, a first epitaxial layer and a second epitaxial layer are formed to cover the fin structure and the dummy gate. Two first mask layers are then formed. Parts of the first and the second epitaxial layers are removed using the two first mask layers as a mask to expose the dummy gate and a nanosheet is formed from the remaining second epitaxial layer. Later, the dummy gate is replaced by a first gate portion, and a second gate portion is formed to encapsulate the nanosheet. Finally, a metal gate is formed between the first gate portion and the second gate portion.
A fabricating method of a transistor with a first fin structure and a first nanosheet, comprising:
Dependencies are inferred from the claim text.