Dynamic test management burn-in device and system

A dynamic test management burn-in system, comprising:

• a power source, configured to provide a first power;
• a plurality of test sockets, each configured to load a device under test;
• a plurality of power converters, electrically coupled with the power source and the plurality of test sockets, the plurality of power converters being configured to receive the first power and to provide a second power to the respective test sockets, and the plurality of power converters being configured to reduce a voltage of the first power and boost a current of the first power to generate the second power;
• a plurality of controllers, electrically coupled to the plurality of power converters;
• and
• a plurality of power detection units, configured to detect at least one of the first power and the second power,
• wherein the plurality of controllers control output or activation of the plurality of power converters based to a detection results from the plurality of power detection units to provide the second power to the respective test sockets.