Devices and Systems for Sensing and Locating Radio Frequency Signals
AssigneeRutgers, The State University of New Jersey
InventorsRanjan Kumar Patel, Narayan B. Mandayam, Ivan Seskar, Shriram Ramanathan
Life of this patent
Estimating the term…
Abstract
Embodiments are directed to methods and systems for sensing radio frequency (RF) signals. The system includes a quantum material film having an electrical resistance, and a source meter coupled to the quantum material film. The source meter is configured to: (i) measure the electrical resistance of the quantum material film, and (ii) output the measured electrical resistance of the quantum material film. A change in the output of the measured electrical resistance indicates a presence of an RF signal.
Claims20
A system for sensing radio frequency (RF) signals, the system comprising:
- a quantum material film having an electrical resistance;
- and
- a source meter coupled to the quantum material film, wherein the source meter is configured to:
- (i) measure the electrical resistance of the quantum material film, and (ii) output the measured electrical resistance of the quantum material film, wherein a change in the output of the measured electrical resistance indicates a presence of an RF signal.
A method for sensing radio frequency (RF) signals, the method comprising:
- receiving one or more signals at a quantum material film having an electrical resistance;
- measuring, using a source meter coupled to the quantum material film, the electrical resistance of the quantum material film;
- and
- outputting, from the source meter, the measured electrical resistance of the quantum material film, wherein a change in the output of the measured electrical resistance indicates a presence of an RF signal from amongst the one or more signals.
Dependencies are inferred from the claim text.