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AssigneeBoard of Trustees of Michigan State University
InventorsChong-Yu RUAN, Xiaoyi SUN, Shen ZAO, Shriraj KUNJIR
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A control system for an ultrafast electron beam microscope and method of using same are provided. In another aspect, software instructions control a master control loop which suppresses low-frequency disturbances, and at least one secondary control loop which controls high-frequency radio frequency (“RF”) jitters to reduce noise, for an ultrafast electron beam microscope and method of using same. A further aspect includes a radio frequency-electron microscope and method of using same, which employs an interactive and cascading phase-locked loop for a high-brightness electron beam microscope.
A method of using an electron microscope, the method comprising:
A method of using an electron microscope, the method comprising:
A method of using an electron microscope, the method comprising:
A method of using an electron microscope comprising using the electron microscope for ultrafast electron imaging by generating an electron probe using a laser-driven photocathode operated at a repetition rate in the MHz to GHz range, and delivering the electron probe to a specimen to obtain high-brightness of at least 3.67×107 A·cm−2sr−1, an electron-bunch throughput of at least 1.6 μA, and femtosecond-scale temporal-resolution imaging, wherein the brightness and beam current scale substantially linearly with the laser repetition rate.
An electron microscope apparatus comprising:
Dependencies are inferred from the claim text.