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US 2026/0139381 A1Published application
Substrate processing method and substrate processing apparatus
AssigneeTokyo Electron Limited
InventorRyosuke AKIMOTO
Life of this patent
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Abstract
A substrate processing method includes processing a surface of silicon with an oxidizing aqueous solution containing a hydrogen peroxide solution and an alkaline liquid to form an oxide film on the surface of the silicon, to form a channel region of a transistor; and forming a gate insulating film of the transistor on a surface of the oxide film.
Claims20
A substrate processing method, comprising:
- processing a surface of silicon with an oxidizing aqueous solution containing a hydrogen peroxide solution and an alkaline liquid to form an oxide film on the surface of the silicon, to form a channel region of a transistor;
- and
- forming a gate insulating film of the transistor on a surface of the oxide film.
A substrate processing apparatus, comprising:
- a holder to hold and rotate a substrate on which silicon, which is to serve as a channel region of a transistor, is formed;
- a liquid supply to supply an oxidizing aqueous solution containing a hydrogen peroxide solution and an alkaline liquid to the substrate held by the holder;
- and
- control circuitry configured to control the holder and the liquid supply to process a surface of the silicon formed on the substrate with the oxidizing aqueous solution to form an oxide film on the surface of the silicon before a gate insulating film of the transistor is formed.
1 more element
A non-transitory computer-readable medium storing instructions that, when executed by a processor, cause the processor to perform operations comprising:
- controlling a holder to hold and rotate a substrate on which silicon, which is to serve as a channel region of a transistor, is formed;
- controlling a liquid supply to supply an oxidizing aqueous solution containing a hydrogen peroxide solution and an alkaline liquid to the substrate to process a surface of the silicon and form an oxide film on the surface of the silicon;
- and
- forming a gate insulating film of the transistor on a surface of the oxide film.
1 more element
Dependencies are inferred from the claim text.