Flash memory quality grading method, flash memory quality grading apparatus, and non-transitory computer-readable storage medium

A flash memory quality grading apparatus, comprising:

• a memory controller, configured to test a plurality of flash memory dies to obtain a bit error count and a read voltage offset value corresponding to each flash memory die;
• and
• a processor, coupled to the memory controller, and configured to:
• calculate a normalized value of the bit error count and a normalized value of the read voltage offset value for each of the plurality of flash memory dies;
• assign a first weight value for the bit error count and a second weight value for the read voltage offset value based on an application type;
• calculate an evaluation score for each of the plurality of flash memory dies based on the normalized value of the bit error count, the normalized value of the read voltage offset value, the first weight value, and the second weight value;
• and
• categorize the plurality of flash memory dies into a plurality of quality grades based on the evaluation score of each flash memory die.

A non-transitory computer-readable storage medium storing instructions that, when executed by a processor of a computing device, cause the computing device to perform a flash memory quality grading method, the method comprising:

• testing a plurality of flash memory dies to obtain a bit error count and a read voltage offset value corresponding to each flash memory die;
• calculating a normalized value of the bit error count and a normalized value of the read voltage offset value for each of the plurality of flash memory dies;
• assigning a first weight value for the bit error count and a second weight value for the read voltage offset value based on an application type;
• calculating an evaluation score for each of the plurality of flash memory dies based on the normalized value of the bit error count, the normalized value of the read voltage offset value, the first weight value, and the second weight value;
• and
• categorizing the plurality of flash memory dies into a plurality of quality grades based on the evaluation score of each flash memory die.