A method for monitoring and managing conduction losses in an electronic circuit comprising at least a first transistor (T1) and a second transistor (T2), the first transistor (T1) and the second transistor (T2) being coupled in parallel, said method comprising:
- a first step E1) consisting in commanding the first transistor (T1) so that it switches to a closed-circuit state, and in measuring a first time taken by the first transistor to close (Df_T1) following the command to switch said first transistor (T1) to the closed-circuit state,
- a second step E2) consisting in commanding the second transistor (T2) so that it switches to a closed-circuit state, the command to switch the second transistor (T2) to a closed-circuit state occurring after a first determined time TM1,
- a third step E3) consisting in commanding the first transistor (T1) so that it switches to an open-circuit state, and in measuring a first time taken by the first transistor to open (Do_T1) following the command to switch said first transistor (T1) to an open-circuit state,
- a fourth step E4) consisting in commanding the second transistor (T2) so that it switches to an open-circuit state, the command to switch the second transistor (T2) to an open-circuit state occurring after a second determined time TM2,
- a fifth step E5) consisting in commanding the second transistor (T2) so that it switches to a closed-circuit state, and in measuring a first time taken by the second transistor to close (Df_T2) following the command to switch said second transistor (T2) to the closed-circuit state,
- a sixth step E6) consisting in commanding the first transistor (T1) so that it switches to a closed-circuit state, the command to switch the first transistor (T1) to a closed-circuit state occurring after a third determined time TM3,
- a seventh step E7) consisting in commanding the second transistor (T2) so that it switches to an open-circuit state, and in measuring a first time taken by the second transistor to open (Do_T2) following the command to switch said second transistor (T2) to an open-circuit state,
- an eighth step E8) consisting in commanding the first transistor (T1) so that it switches to an open-circuit state, the command to switch the first transistor (T1) to an open-circuit state occurring after a fourth determined time TM4,
- a ninth step E9) consisting in storing in a memory the values of the first time taken by the first transistor to close (Df_T1), the first time taken by the first transistor to open (Do_T1), the first time taken by the second transistor to close (Df_T2), and the first time taken by the second transistor to open (Do_T2),
- a tenth step E10) consisting in executing steps E1) to E9) at least n times, and
- an eleventh step E11) consisting in taking an average of the n measurements of the first time taken by the first transistor to close (Df_T1), an average of the n measurements of the first time taken by the first transistor to open (Do_T1), an average of the n measurements of the first time taken by the second transistor to close (Df_T2), and an average of the n measurements of the first time taken by the second transistor to open (Do_T2),
- a twelfth step E12) consisting in performing steps E1) to E11) m times, and
- a thirteenth step E13) consisting in comparing the m values of the respective n averaged values,
- wherein when at least one result of the comparison of the m values drifts from the average value by p% then generate a software alert and wherein when a result of the comparison of the m values of the n averaged values of the first time taken by the first transistor to close (Df_T1), or the m values of the n averaged values of the first time taken by the first transistor to open (Do_T1), or the m averaged values of the n values of the first time taken by the second transistor to close (Df_T2), or the m averaged values of the n values of the first time taken by the second transistor to open (Do_T2) drifts by p % then activate the transistor corresponding to the value that has drifted only after the other transistor.