Measurement system and measurement method
AssigneeNEC Corporation
InventorsJohn Kenji David CLARK, Tatsunori Omiya, Toshifumi Nakamura
Life of this patent
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AssigneeNEC Corporation
InventorsJohn Kenji David CLARK, Tatsunori Omiya, Toshifumi Nakamura
Estimating the term…
A light source outputs a first optical signal having a first wavelength to a wavelength converter including a reception unit and transmission unit. The reception unit coherently detects an optical signal having the first wavelength and outputs analog signals associated to a plurality of phases. The transmission unit multiplexes a plurality of optical signals and outputs the optical signals as second optical signals and includes a driver and modulators modulating light having a second wavelength to the plurality of optical signals according to modulation signals from the driver. A controller controls the wavelength converter so that one specific modulation unit outputs an optical signal, the other modulators do not output optical signals, and the specific modulation unit is sequentially switched. A measurement unit acquires waveforms of optical signals having the plurality of phases from the second optical signal and measures skew based on intensities of the waveforms.
A measurement system comprising:
A measurement system comprising:
A measurement method comprising:
Dependencies are inferred from the claim text.