Dc bias in plasma process
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsSheng-Liang Pan, Bing-Hung Chen, Chia-Yang Hung, Jyu-Horng Shieh, Shu-Huei Suen, Syun-Ming Jang, Jack Kuo-Ping Kuo
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsSheng-Liang Pan, Bing-Hung Chen, Chia-Yang Hung, Jyu-Horng Shieh, Shu-Huei Suen, Syun-Ming Jang, Jack Kuo-Ping Kuo
Estimating the term…
Embodiments described herein relate to plasma processes. A plasma process includes generating a plasma containing negatively charged oxygen ions. A substrate is exposed to the plasma. The substrate is disposed on a pedestal while being exposed to the plasma. While exposing the substrate to the plasma, a negative direct current (DC) bias voltage is applied to the pedestal to repel the negatively charged oxygen ions from the substrate.
A method for selective ion control in a plasma process, comprising:
A method for sequential plasma treatments with a single DC bias, comprising:
A method for combined photoresist removal and surface treatment, comprising:
Dependencies are inferred from the claim text.