Method and device for testing optical link based on optical frequency domain reflectometry
AssigneeBeijing Aerospace Institute for Metrology and Measurement Technology
InventorsYuxiang FENG, Yinxiao MIAO, Chen WU, Meng ZHANG, Jingcan MA, Xiang TAO, Yixuan ZHANG, Ya GAO, Yapeng PEI, Tieli ZHANG
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