Wafer surface cleaning process
AssigneeCorning Incorporated
InventorsDongmei Liu, Chih Yuan Lu, Yong Shen, Chia Ying Wu
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AssigneeCorning Incorporated
InventorsDongmei Liu, Chih Yuan Lu, Yong Shen, Chia Ying Wu
Estimating the term…
A method of removing particles from a surface of a wafer, the method including cleaning the wafer with an aqueous first solution. The aqueous first solution including a mixture of a first detergent, a second detergent, and a third detergent. The first detergent including an aqueous solution comprising a pH buffer, an inorganic alkali, a wetting and emulsifying agent, and a chelating agent. The second detergent including an aqueous solution comprising an emulsifier, a pH buffer, an inorganic alkali, a double electric agent, and a chelating agent. The third detergent including an aqueous solution comprising a pH buffer, a wetting and penetration agent, an antistatic and emulsifying agent, and a chelating agent.
A method of removing particles from a surface of a wafer, the method comprising:
A cleaning system for removing polishing particles from surfaces of wafers that have been polished, the cleaning system comprising:
Dependencies are inferred from the claim text.