Semiconductor device and method of manufacturing the same
AssigneeRenesas Electronics Corporation
InventorsKenji IKURA, Mitsuo TOKUMARU
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AssigneeRenesas Electronics Corporation
InventorsKenji IKURA, Mitsuo TOKUMARU
Estimating the term…
A semiconductor device having an improved bonding reliability of wire bonding is provided. The semiconductor device includes a semiconductor chip, a die pad, an inner lead, and a bonding wire. The semiconductor chip has a first lower surface, and a bonding pad provided on a first upper surface. The bonding pad has a second upper surface. The die pad has a third upper surface. The inner lead has a fourth upper surface. The semiconductor chip is mounted on the die pad such that the first lower surface faces the third upper surface. The bonding pad and the inner lead are electrically connected to each other via the bonding wire. In cross-sectional view, the second upper surface, to which the bonding wire is connected, of the bonding pad is located at the same height as the fourth upper surface, to which the bonding wire is connected, of the inner lead.
A semiconductor device comprising:
A method of manufacturing a semiconductor device, comprising steps of:
Dependencies are inferred from the claim text.