Wafer processing method
AssigneeDisco Corporation
InventorsAkira Mizutani, Hayato Iga
Life of this patent
Estimating the term…
Loading patent…
AssigneeDisco Corporation
InventorsAkira Mizutani, Hayato Iga
Estimating the term…
A wafer processing method for removing a chamfered portion of a first wafer that includes producing a provisionally bonded wafer in which first and second wafers are weakly bonded; forming a ring-shaped modified layer by applying a laser beam to an inner side adjacent to a chamfered portion formed at an outer periphery of the first wafer of the provisionally bonded wafer, and detaching the chamfered portion from the second wafer, with the modified layer serving as a starting point; and producing a completely strongly bonded wafer by annealing the provisionally bonded wafer. The wafer processing method further includes grinding and thinning the first wafer, with the second wafer being held on a chuck table constituting a grinding apparatus, and removing the chamfered portion of the first wafer that is detached from the second wafer, with the modified layer serving as a starting point.
A wafer processing method for bonding a first wafer and a second wafer and processing the first wafer, the wafer processing method comprising:
Dependencies are inferred from the claim text.