Substrate, method of inspecting the substrate, and electronic device including the substrate

A substrate comprising:

• a cell area in which a plurality of cells is disposed;
• and
• a peripheral area surrounding at least a portion of the cell area;
• a first alignment key disposed in the peripheral area;
• a second alignment key disposed in the peripheral area and spaced apart from the first alignment key in a plan view;
• and
• third alignment keys disposed in the cell area, corresponding one-to-one with the plurality of cells, wherein each of the third alignment keys is disposed on one side of a corresponding cell among the plurality of cells.

An electronic device comprising:

• a display device;
• and
• a processor configured to drive the display device,
• wherein the display device is inspected by a method of inspecting a substrate comprising:
• placing a substrate comprising a plurality of cells, a first alignment key, and a second alignment key spaced apart from the first alignment key in a plan view on a stage;
• performing a first correcting which corrects misalignment of a first camera using the first alignment key;
• obtaining a first image by capturing an image of the substrate with the first camera;
• detecting a foreign substance in the first image;
• moving the stage such that the substrate overlaps a second camera in a plan view;
• performing a second correcting which corrects misalignment of the second camera using the second alignment key;
• and
• obtaining a second image by capturing, with the second camera, an image of a cell among the plurality of cells in which the foreign substance is detected.