Automated control of process chamber components
AssigneeLam Research Corporation
InventorsKapil Sawlani, Paul Franzen, Patging John Elsworth Martin
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AssigneeLam Research Corporation
InventorsKapil Sawlani, Paul Franzen, Patging John Elsworth Martin
Estimating the term…
Methods, systems, and media for deposition control in a process chamber are provided. In some embodiments, a method comprises (a) obtaining, at a present time, information indicating a status of one or more components of the process chamber during performance of a deposition process on one or more wafers. The method may comprise (b) determining whether adjustments to one or more control components of the process chamber are to be made by providing an input based on the obtained information to a trained machine learning model configured to determine adjustments as an output, wherein the adjustments to the one or more control components cause a change in the deposition process. The method may comprise (c) transmitting instructions to a controller of the process chamber that cause the adjustments to the one or more control components to be implemented.
A method for deposition control in a process chamber, the method comprising:
A computer program product comprising a non-transitory computer readable medium on which is provided computer executable instructions for causing a computational system to perform a method for deposition control in a process chamber, wherein the instructions comprise instructions for:
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Dependencies are inferred from the claim text.