Layer 1 Measurement Delay Beam Management
AssigneeApple Inc.
InventorsManasa RAGHAVAN, Konstantinos SARRIGEORGIDIS, Jie CUI, Yang TANG, Xiang CHEN, Dawei ZHANG
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Abstract
An apparatus configured to process, based on signaling from a network, a measurement configuration comprising a first set of beams and a number of sample measurements to be performed for each of the first set of beams and perform Layer 1 (L1) measurements for reference signals transmitted on each of the first set of beams, wherein measurement results for the reference signals comprise L1 Reference Signal Received Power (RSRP).
Claims20
An apparatus comprising processing circuitry coupled to memory, wherein the processing circuitry is configured to:
- process, based on signaling from a network, a measurement configuration comprising a first set of beams and a number of sample measurements to be performed for each of the first set of beams;
- and
- perform Layer 1 (L1) measurements for reference signals transmitted on each of the first set of beams, wherein measurement results for the reference signals comprise L1 Reference Signal Received Power (RSRP).
An apparatus comprising processing circuitry coupled to memory, wherein the processing circuitry is configured to:
- generate, for transmission to a user equipment (UE), a measurement configuration comprising a first set of beams and a number of sample measurements to be performed for each of the first set of beams;
- and
- generate reference signals to be transmitted to the UE on each of the first set of beams.
Dependencies are inferred from the claim text.