Rf impedance matching with continuous wave and pulsing sources
AssigneeASM IP Holding B.V.
InventorsImran Ahmed BHUTTA, Tomislav Lozic
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AssigneeASM IP Holding B.V.
InventorsImran Ahmed BHUTTA, Tomislav Lozic
Estimating the term…
In one embodiment, a system for semiconductor fabrication includes a continuous wave (CW) radio frequency (RF) source and a pulsing RF source. The system further includes a matching network positioned between the CW RF source and the load and a control circuit. The control circuit receives one or more signals indicative of values of a parameter of the pulsing RF signal. For the first pulse level, impedance matching between the CW RF source and the load occurs by altering the at least one EVRE based on a value of the parameter during the first pulse level time duration. For the second pulse level, impedance matching occurs by altering the at least one EVRE based on a value of the parameter during the second pulse level time duration.
A system comprising:
A method of impedance matching comprising:
A semiconductor processing tool comprising:
Dependencies are inferred from the claim text.