Voltage verification at a memory system

A method, comprising:

• receiving a first signal that indicates to test a voltage source of a set of voltage sources corresponding to a data line of a channel of a memory system;
• coupling the voltage source of the set with an analog-to-digital converter to form a conductive path based at least in part on receiving the first signal;
• and
• generating, using the analog-to-digital converter, a signal that indicates a value of a reference voltage output from the voltage source based at least in part on the conductive path.

A memory system, comprising:

• one or more memory devices;
• and
• processing circuitry coupled with the one or more memory devices and configured to cause the memory system to:
• receive a first signal that indicates to test a voltage source of a set of voltage sources corresponding to a data line of a channel of the memory system;
• couple the voltage source of the set with an analog-to-digital converter to form a conductive path based at least in part on receiving the first signal;
• and
• generate, using the analog-to-digital converter, a signal that indicates a value of a reference voltage output from the voltage source based at least in part on the conductive path.