Generating additional samples for industrial processes
AssigneeHoneywell International Inc.
InventorsSahil Vartak, Junda Zhu, Sabina Azizli, Mitchell O'Brien
Life of this patent
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AssigneeHoneywell International Inc.
InventorsSahil Vartak, Junda Zhu, Sabina Azizli, Mitchell O'Brien
Estimating the term…
Systems and methods for generating additional samples for industrial processes are described herein. In certain embodiments, a system includes a memory configured to store a model associated with a physical process, wherein the model is configured to receive one or more input values and provide one or more output values, wherein the input values represent potential input parameters for the physical process and the output values represent potential measures of process information. The system also includes one or more processors executing computer executable instructions that cause the processors to receive the input values; generate the output values by executing the model using the input values as model inputs; provide the output values to replace one or more measures based on samples acquired from the physical process; and analyze the physical process based on the output values.
A system comprising:
A method comprising:
A system comprising:
Dependencies are inferred from the claim text.