Thickness measuring system and method

Abstract

A system monitors a substrate condition within industrial equipment, and includes at least one sensor device. The sensor device is coupled to a non-wear side of the substrate, wherein a wear side of the substrate is subject to wear from work material moving within the industrial equipment. The sensor device is communicatively or electrically coupled to a power source. The sensor device is configured to be coupled to a data acquisition device to communicate information regarding a condition of the substrate while the at least one sensor device is coupled to the substrate. The sensor device is configured to measure a thickness of the substrate and generate thickness measurement information as the information regarding the condition of the substrate.

Dependencies are inferred from the claim text.