System and methods for fast error detection and rendering for additive manufacturing using structured light
AssigneePurdue Research Foundation
InventorsSong Zhang, Jack M. Girard
Life of this patent
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AssigneePurdue Research Foundation
InventorsSong Zhang, Jack M. Girard
Estimating the term…
A projector may project a fringe pattern onto a deposited layer from an additive manufacturing printer. A camera may capture set of fringe images of the deposited layer. Then, a system may compute a two-dimensional absolute phase map that encodes surface height information of the deposited layer. The system may generate a threshold phase map corresponding to an intended geometry of the deposited layer. The system may compare the absolute phase map to the threshold phase map on a pixel-by-pixel basis to detect error regions in the deposited layer. The comparison may be performed in the two-dimensional phase domain without reconstructing a complete three-dimensional point cloud. The system may selectively reconstruct three-dimensional data only for pixels corresponding to the detected regions, thereby reducing computational resources required for in-situ process monitoring.
A computer-implemented method, comprising:
A system, comprising:
Dependencies are inferred from the claim text.