Synthetic training data for endpointing models

A charged particle beam system, comprising:

• a source of charged particles, a machine-actuated sample holder, and control circuitry operatively coupled to:
• a memory that stores computer executable components;
• and
• a processor that executes the computer executable components stored in the memory to cause the processor to perform operations comprising:
• generating image data of a sample disposed in the sample holder;
• inputting a portion of the image data to an analytical model that is trained on a dataset of synthetic image data describing synthetic images corresponding to the image data of the sample;
• and
• generating, by the analytical model, control instructions configured to modulate an operation of the source of charged particles or the sample holder in response to being processed by the control circuity.