Extrinsic calibration parameter generating device, system, and method
AssigneeHTC Corporation
InventorChao-Shuan HUANG
Life of this patent
Estimating the term…
Loading patent…
AssigneeHTC Corporation
InventorChao-Shuan HUANG
Estimating the term…
An extrinsic calibration parameter generating device, system, and method are provided. Each of sensors of the device generates an observation data corresponding to a spatial point. A processor of the device calculates a spatial position of the spatial point indicated by each of the observation data based on the observation data of each of the sensors. The processor compares the spatial position indicated by each of the observation data to determine whether each of the observation data belongs to an outlier value or a normal value. In response to the observation data corresponding to a first sensor belonging to the outlier value, the processor generates an extrinsic calibration parameter corresponding to the first sensor based on the observation data of each of at least one second sensor.
An extrinsic calibration parameter generating device, comprising:
A extrinsic calibration parameter generating method, being adapted for use in an electronic device, wherein the extrinsic calibration parameter generating method comprises:
An extrinsic calibration parameter generating system, comprising:
Dependencies are inferred from the claim text.