Intrinsic temperature measurement for cross temperature handling in memory devices

A method comprising:

• measuring, by a processing device, a read temperature metric associated with a segment of a memory device;
• estimating a read temperature based on the read temperature metric;
• determining a cross temperature value based on the read temperature and a write temperature;
• determining a set of cross temperature voltage offsets associated with the cross temperature value;
• and
• associating the set of cross temperature voltage offsets with the segment of the memory device.

A non-transitory computer-readable storage medium comprising instructions that, when executed by a processing device, cause the processing device to perform operations comprising:

• measuring a read temperature metric associated with a segment of a memory device;
• estimating a read temperature based on the read temperature metric;
• determining a cross temperature value based on the read temperature and a write temperature;
• determining a set of cross temperature voltage offsets associated with the cross temperature value;
• and
• associating the set of cross temperature voltage offsets with the segment of the memory device.