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US 2026/0092967 A1Published application
Built-in self-testing system
AssigneeRenesas Electronics Corporation
InventorAndreas TWARDY
Life of this patent
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Abstract
A built-in self-test (BIST) system for an electronic circuit is provided. The system includes test circuitry and a clock circuit. The test circuitry applies a test procedure to the electronic circuit. The clock circuit is configured to provide a clock signal to the test circuitry and to adjust a clock frequency of the clock signal.
Claims20
A built-in self-test (BIST) system for an electronic circuit, comprising:
- test circuitry for applying a test procedure to the electronic circuit;
- and
- a clock circuit configured to:
- provide a clock signal to the test circuitry;
- and
- adjust a clock frequency of the clock signal.
3 more elements
An apparatus comprising:
- an electronic circuit;
- and
- a built-in self-test (BIST) system for the electronic circuit, the BIST system comprising:
- test circuitry for applying a test procedure to the electronic circuit;
- and
- a clock circuit configured to:
- provide a clock signal to the test circuitry;
- and
- adjust a clock frequency of the clock signal provided to the test circuitry.
6 more elements
A method of performing a test procedure on an electronic circuit using a built-in self-test (BIST) system, the method comprising:
- applying a test procedure to the electronic circuit using test circuitry;
- providing a clock signal to the test circuitry using a clock circuit;
- and
- adjusting a clock frequency of the clock signal provided to the test circuitry using the clock circuit.
1 more element
Dependencies are inferred from the claim text.