Magnetic wrap up effects screening
AssigneeSchneider Electric USA, Inc.
InventorsCollin Richard FISCHELS, Juan Ignacio Melecio Ramirez, Adrian Abdala Rendon Hernandez
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AssigneeSchneider Electric USA, Inc.
InventorsCollin Richard FISCHELS, Juan Ignacio Melecio Ramirez, Adrian Abdala Rendon Hernandez
Estimating the term…
Method and system for screening a device under test. A nest is configured for coupling to a device under test (DUT) and for receiving an output signal from the DUT during screening. A loop formed in an external conductor is positioned in proximity to the DUT. A test module compares the output signal of the DUT when the external conductor is not energized to the output signal of the DUT when the external conductor is energized and generating a magnetic field at the loop. The test module screens the DUT for a susceptibility to magnetic wrap-up effects based on the comparison.
A system for screening a device under test, the system comprising:
A system for screening a current transformer for magnetic wrap-up effects, the system comprising:
A method of screening a device under test, the method comprising:
Dependencies are inferred from the claim text.