Semiconductor device and method for manufacturing semiconductor device
AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorsDaisuke KUROSAKI, Miwa TANABE, Seiji YASUMOTO, Junichi KOEZUKA
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AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorsDaisuke KUROSAKI, Miwa TANABE, Seiji YASUMOTO, Junichi KOEZUKA
Estimating the term…
A semiconductor device is provided over a base insulating layer including hydrogen. A first conductive layer, a spacer, and a second conductive layer are provided over the base insulating layer. The spacer and the second conductive layer comprise an opening reaching the first conductive layer in which a metal oxide layer is provided. The metal oxide layer includes a region in contact with the first conductive layer and the second conductive layer. The first conductive layer and the second conductive layer function as one and the other of a source electrode and a drain electrode of the transistor. A gate insulating layer is provided over the metal oxide layer to include a region positioned in the opening. A gate electrode is provided to include a region facing the metal oxide layer with the gate insulating layer between the region and the metal oxide layer in the opening.
A semiconductor device comprising:
A semiconductor device comprising:
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A method for manufacturing a semiconductor device,
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Dependencies are inferred from the claim text.