Communicating with a dut using protocol-agnostic circuitry
AssigneeTeradyne, Inc.
InventorsJason Messier, Gregory C. Warwar, Jeffrey Benagh
Life of this patent
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AssigneeTeradyne, Inc.
InventorsJason Messier, Gregory C. Warwar, Jeffrey Benagh
Estimating the term…
An example apparatus is configured to electrically connect to a device under test (DUT). The apparatus includes a first interface circuit to communicate with a test instrument using a first protocol and a second interface circuit to receive signals containing data from the DUT having a second protocol. The second interface circuit is configured to oversample the signals containing data in voltage and time to produce sampled data. Oversampling includes sampling the signals containing data at a rate that is higher than the Nyquist rate. Circuitry is configured to receive the sampled data from the second interface circuit, to generate the data having the first protocol based on the sampled data, and to output the data having the first protocol to the test instrument via the first interface circuit.
An apparatus configured to electrically connect to a device under test (DUT), the apparatus comprising:
A method performed by an apparatus configured to electrically connect to a device under test (DUT), the apparatus comprising (i) a first interface circuit to communicate with a test instrument using a first protocol, and (ii) a second interface circuit to communicate with the DUT using a second protocol, the method comprising:
Dependencies are inferred from the claim text.