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AssigneeSamsung SDI Co., Ltd.
InventorsHae Won Lee, Hyeong Min Lee, Jae Hyeon Kim, Dong Ah Lee
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The present technology relates to an apparatus and method for predicting quality of a product and a computer program and is directed to providing a solution capable of increasing a manufacturing yield of finished products and reducing a discard rate by verifying a tolerance range of a process factor applied to a product manufacturing process and optimizing a tolerance range of an unverified process factor. The present technology may provide a configuration in which a second target value of a performance factor of the finished product and an uncertainty range of the second target value are predicted from a first target value of a target process factor applied to a target manufacturing process and a tolerance range of the first target value using the performance prediction model, and the predicted uncertainty range is compared with a predefined reference range to verify the tolerance range of the first target value.
An apparatus for predicting quality of a product, comprising:
A method of predicting quality of a product, the method comprising:
A non-transitory computer-readable medium having instructions stored thereon that, when executed by a processor, cause the processor to execute operations by performing a method comprising:
Dependencies are inferred from the claim text.