AI-Driven Defect Remediation System Based on Bias Detection
AssigneeBank of America Corporation
InventorsJeonghoon Lee, Yogi Ahuja, Nagrajeshwari Vernekar, Ayyappan Thirukkannan, Nishit Jain, Dhivya Sena Jeyaram Mohan, Palak Valecha, Deelip Bandarkar, Silpa Mokkapati, Veena Kedia, Subhashish Panda, Prabhakar Devisetty, Vikas Kumar
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