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AssigneeQUALCOMM Incorporated
InventorsDipti Ranjan Pal, Deepak Agrawal, Aseem Pandey, Shih-Hsin Jason Hu
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Temperature-aware built-in self-test (BIST) control system for selectively controlling activation of BIST circuits in a processor-based system to maintain temperature limit and related methods. The temperature-aware BIST control system is configured to selectively control the number of BIST circuits in the processor-based system activated during the same time based on a temperature limit indicator related to a sensed temperature(s) in the processor-based system and whether such is within a defined temperature threshold(s) and/or temperature change rate threshold(s), which may be programmable. In this manner, the safety manager circuit can dynamically and selectively control the number of BIST circuits activated based on temperature according to the BIST control policy(ies) to reduce or avoid circuit failures due to excess temperature, while at the same time maximizing the staggering (i.e., overlapping) of BIST circuit activations to maximize testing speed.
A processor-based system comprising an integrated circuit (IC), comprising:
A method of controlling activation of built-in self-test (BIST) circuits in a processor-based system comprising a plurality of computing devices and a plurality of BIST circuits each associated with a computing device of the plurality of computing devices and configured to be activated to test its associated computing device, the method comprising:
Dependencies are inferred from the claim text.