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US 2026/0086059 A1Published application
Detecting damage to integrated circuits
AssigneeApple Inc.
InventorDong Zheng
Life of this patent
Estimating the term…
Abstract
A device includes an integrated circuit with multiple layers. A sensing trace is disposed on a first layer of the integrated circuit. The sensing trace includes a first node coupled to a ground and a second node coupled to a current source. The device also includes a resistor circuit coupled to the sensing trace. The device further includes a sensing circuit configured to detect damage to one or more layers of the multiple layers based on the sensing trace and the resistor circuit.
Claims20
An apparatus, comprising:
- an integrated circuit, the integrated circuit comprising multiple layers, the multiple layers comprising a first layer;
- a sensing trace disposed on the first layer of the integrated circuit, the sensing trace comprising a first node coupled to a ground and a second node coupled to a current source;
- a resistor circuit coupled to the sensing trace;
- and
- a sensing circuit configured to detect damage to one or more layers of the multiple layers based on the sensing trace and the resistor circuit.
2 more elements
A method, comprising:
- applying a current to a sensing trace disposed on a first layer of an integrated circuit, the sensing trace comprising a first node coupled to a ground and a second node coupled to a current source;
- determining a resistance of the sensing trace;
- and
- determining whether there may be damage to the integrated circuit based on the resistance of the sensing trace and a target resistance.
1 more element
A circuit, comprising:
- a first layer comprising one or more active devices;
- and
- a second layer disposed above the first layer, the second layer comprising:
- a sensing trace comprising a first node coupled to a ground and a second node coupled to a current source;
- and
- a resistor circuit coupled to the sensing trace, wherein the sensing trace is coupled to a sensing circuit configured to detect damage to the one or more active devices based on the sensing trace and the resistor circuit.
3 more elements
Dependencies are inferred from the claim text.