Testing probe for a haptic device

Abstract

Inconclusive and inconsistent results from existing haptic testing systems, e.g. for trackpads, which include rigidly mounted resistive load cells and accelerometers, prevent accurate results, especially in a high-volume production context. The use of a rigidly mounted sensor is unsuitable because a trackpad will generally be softer than the actuation system, whereby, when the haptic event is fired, the vast majority of the energy will be lost in the trackpad, while the sensor remains almost stationary. Accordingly, an improved test probe for a haptic device configured for mounting on a robotic arm, comprises: a contact tip configured for contacting the haptic device; a sensor configured for measuring a threshold force of the piezoelectric actuator device, and an haptic characteristic, e.g. acceleration, of a resulting haptic response thereof at a same time and a same location; and a compliant element configured for enabling the sensor to move relative to the haptic device.

Dependencies are inferred from the claim text.