Measuring system for process automation
AssigneeVEGA Grieshaber KG
InventorTimo Seckinger
Life of this patent
Estimating the term…
Abstract
A measuring system for process automation in an industrial or private environment, with a first field device for capturing first process measurement data and a computing arrangement for evaluating the captured first process measurement data, the computing arrangement determining a new installation position and/or new parameterization of the first field device on the basis of the evaluation of the captured first process measurement data in order to improve the measurement result.
Claims20
A measurement system for process automation in an industrial or private environment, comprising:
- a first field device configured to capture first process measurement data;
- and
- computing circuitry configured to evaluate the captured first process measurement data,
- wherein the computing circuitry is further configured to determine a new installation position and/or a new parameterization of the first field device on a basis of evaluation of the captured first process measurement data in order to improve a measurement result.
A method for operating a measuring system in an industrial or private environment, comprising:
- capturing first process measurement data;
- evaluating the captured first process measurement data;
- and
- determining, based on an evaluation of the captured first process measurement data, a new installation position, and/or new parameterization of a first field device in order to improve a measurement result of the first field device.
A non-transitory computer readable medium having stored thereon a program element that, when executed by computing circuitry of a measurement system, causes the computing circuitry to be configured to
- capture first process measurement data;
- evaluate the captured first process measurement data;
- and
- determine, based on an evaluation of the captured first process measurement data, a new installation position, and/or new parameterization of a first field device in order to improve a measurement result of the first field device.
Dependencies are inferred from the claim text.