Semiconductor processing tool and methods of operation

Abstract

A deposition tool includes a rotatable chuck and/or a pulsed direct current (DC) bias source. The pulsed DC source may be used to pulse a DC power in the processing chamber to achieve a lower electron temperature in the processing chamber, which enables the material from a material target to be directed toward the semiconductor substrate in a highly directional manner. This enables a low angle of deposition to be achieved for depositing the material, which enables the material to be evenly and symmetrically deposited onto sidewalls of recesses in the semiconductor substrate. Additionally and/or alternatively, the rotatable chuck may be used to rotate the semiconductor substrate during deposition of the layer onto the semiconductor substrate to compensate for nonuniformities in the deposition rate of the layer across the semiconductor substrate. This enables a high horizontal thickness uniformity across the semiconductor substrate.

Dependencies are inferred from the claim text.