Measurement instrument having time, frequency and logic domain channels
AssigneeKeysight Technologies, Inc.
InventorKen A. Nishimura
Life of this patent
Estimating the term…
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AssigneeKeysight Technologies, Inc.
InventorKen A. Nishimura
Estimating the term…
A measurement apparatus for measuring signals from a DUT includes a time domain receiver for receiving from the DUT a DUT time domain output signal in a time domain and providing a time domain input signal; a logic domain receiver for receiving from the DUT a DUT logic domain output signal including logic levels over time; an LO for generating an LO signal; a mixer for receiving from the DUT a DUT frequency domain output signal in a frequency domain and for mixing the DUT frequency domain output signal and the LO signal to provide a frequency downconverted frequency domain signal; a frequency domain receiver for receiving the frequency downconverted frequency domain signal and providing a frequency domain input signal; and a controller for determining control signals in response to the logic levels from the DUT logic domain output signal for controlling at least one operation of the LO.
A measurement apparatus for measuring signals from a device under test (DUT), the measurement apparatus comprising:
A measurement system for measuring signals from a device under test (DUT), the measurement system comprising:
A method for operating a multi-domain oscilloscope, comprising:
Dependencies are inferred from the claim text.