Semiconductor device
AssigneeFuji Electric Co., Ltd.
InventorsMisaki UCHIDA, Takashi YOSHIMURA, Shuntaro YAGUCHI
Life of this patent
Estimating the term…
Loading patent…
AssigneeFuji Electric Co., Ltd.
InventorsMisaki UCHIDA, Takashi YOSHIMURA, Shuntaro YAGUCHI
Estimating the term…
Provided is a semiconductor device which is provided in a semiconductor substrate having a first principal surface and a second principal surface and containing a bulk dopant, the semiconductor device including: in the semiconductor substrate, a first low concentration region of a first conductivity type which has a carrier concentration lower than a bulk concentration that is a concentration of the bulk dopant; and a first high concentration region of the first conductivity type which has a first carrier concentration peak at a position in contact with the first low concentration region on a side of the first principal surface and has a carrier concentration higher than the bulk concentration, in which a hydrogen concentration peak is not provided at a position overlapping with the first carrier concentration peak.
A semiconductor device which is provided in a semiconductor substrate having a first principal surface and a second principal surface and containing a bulk dopant, the semiconductor device comprising:
Dependencies are inferred from the claim text.