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US 2026/0066027 A1Published application
Handling power-loss reset events with bad block risk mitigation
AssigneeMicron Technology, Inc.
InventorsScott Anthony Stoller, Robert Winston Mason
Life of this patent
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Abstract
Various example embodiments provide for handling a power-loss reset (PLRESET) event in a memory system, such as a memory sub-system, with a technique that mitigates the risk of a good block being marked as bad, a memory die being retired prematurely, or both.
Claims20
A system comprising:
- a memory device;
- and
- a processing device, operatively coupled to the memory device, configured to perform operations comprising:
- detecting that a power-loss reset (PLRESET) event has occurred on the memory device while a memory operation is being performed on a memory die of the memory device, the PLRESET event comprising the memory die aborting the memory operation in response to a supply voltage to the memory die dropping below a threshold voltage value;
- and
- in response to detecting that the PLRESET event occurred on the memory device while the memory operation is being performed on the memory die:
- marking one or more blocks of the memory die involved in the memory operation as bad blocks;
- and
- adding the one or more blocks to a set of bad blocks to be later tested by a test process.
6 more elements
At least one non-transitory machine-readable storage medium comprising instructions that, when executed by a processing device, cause the processing device to perform operations comprising:
- detecting that a power-loss reset (PLRESET) event has occurred on a memory device while a memory operation is being performed on a memory die of the memory device, the PLRESET event comprising the memory die aborting the memory operation in response to a supply voltage to the memory die dropping below a threshold voltage value;
- and
- in response to detecting that the PLRESET event occurred on the memory device while the memory operation is being performed on the memory die:
- causing data, stored on one or more blocks of the memory die involved in the memory operation, to be moved to a set of available blocks on the memory device;
- and
- returning the one or more blocks to the set of available blocks.
3 more elements
A method comprising:
- detecting, a processing device, that a power-loss reset (PLRESET) event has occurred on a memory device while a memory operation is being performed on a memory die of the memory device, the PLRESET event comprising the memory die aborting the memory operation in response to a supply voltage to the memory die dropping below a threshold voltage value;
- and
- in response to detecting that the PLRESET event occurred on the memory device while the memory operation is being performed on the memory die, closing one or more blocks of the memory die involved in the memory operation, the one or more closed blocks allowing data stored on the one or more closed blocks to be read while preventing additional data from being written to the one or more closed blocks.
Dependencies are inferred from the claim text.