Abnormal program sequence detection
AssigneeMicron Technology, Inc.
InventorsYI LIN LAI, JEN HUNG LIAO, WAI LEONG CHIN, PIN HSUEH LAI, EDRIC GOH
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AssigneeMicron Technology, Inc.
InventorsYI LIN LAI, JEN HUNG LIAO, WAI LEONG CHIN, PIN HSUEH LAI, EDRIC GOH
Estimating the term…
A system and method for detecting abnormal program sequences on a memory device. In some examples, a timing process is initiated by either starting a timer or recording an initial timer value from the timer. A status register of the memory device is checked in response to initiating the timing process to determine whether the memory device is in a busy state corresponding to performing the program operation. The timer is stopped or a current timer value is recorded from the timer in response to determining that the memory device is not in the busy state. A determination is made to determine an elapsed time of the timer since being started or based on the initial and current timer values to provide a checked operation time. The checked operation time and the defined operation time are evaluated to determine whether the program sequence for implementing the program operation was abnormal.
A method for detecting an abnormal program sequence on a memory device, the method comprising:
A system for detecting an abnormal program sequence in a non-volatile memory system, the system comprising:
A non-transitory computer-readable medium storing instructions that, when executed by a processor, perform operations for detecting an abnormal program sequence in a non-volatile memory system, the operations comprising:
Dependencies are inferred from the claim text.