Detecting die failure in memory sub-systems
AssigneeMicron Technology, Inc.
InventorsSu Juan Wang, Guang Shen
Life of this patent
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AssigneeMicron Technology, Inc.
InventorsSu Juan Wang, Guang Shen
Estimating the term…
A plurality of commands comprising data to be written to a plurality of blockstripes, each blockstripe comprising at least one block from each of a plurality of memory devices, can be received from a high-speed processing device. Based on determining a first memory device associated with a first blockstripe experiences program failure in response to execution of a first command, whether a second memory device associated with a second blockstripe experiences program failure in response to execution of a second command, can be determined. Based on detecting consecutive program failure on the memory device, whether a program failure count associated with the memory device satisfies a program failure threshold can be determined. Based on determining the program failure count associated with the memory device satisfies the program failure threshold, retirement of the memory device can be initiated.
A system comprising:
A method comprising:
A non-transitory computer readable storage medium comprising instructions that, when executed by a plurality of channel cores, cause the plurality of channel cores to perform operations comprising:
Dependencies are inferred from the claim text.