US 2026/0063703 A1 · AUTOMATIC TEST METHOD, AUTOMATIC TEST DEVICE, AND STORAGE MEDIUM

Abstract

The present disclosure provides an automatic test method, an automatic test device, and a storage medium. The automatic test method is applied to the automatic test device. The automatic test device includes a driving mechanism, a detection mechanism and a dual-probe mechanism. The automatic test method includes controlling the driving mechanism to drive a probe in the dual-probe mechanism to move to a position of a detection point of a material. When the probe contacts the detection point, the detection mechanism collects measurement data of the detection point. Determining whether the material is an unqualified material according to the measurement data and preset standard information. When the material is the unqualified material, abnormal data is obtained from the measurement data. The present disclosure reduces human errors, improves data accuracy and reliability, and significantly improves work efficiency.

Claims20

Dependent claims

An automatic test method applied to an automatic test device, which comprises a driving mechanism, a detection mechanism and a dual-probe mechanism, the automatic test method comprising:

controlling the driving mechanism to drive a probe in the dual-probe mechanism to move to a position of a detection point of a material that is to be tested;
in response to the probe contacting the detection point, collecting measurement data of the detection point through the detection mechanism;
determining whether the material is an unqualified material according to the measurement data and preset standard information;
and
in response to the material being determined to be the unqualified material, obtaining abnormal data from the measurement data.

2 more elements

An automatic test device, comprising a driving mechanism, a detection mechanism, a dual-probe mechanism, a storage device, and a processor, an automatic testing program being stored in the storage device, which when executed by the processor, causing the processor to:

control the driving mechanism to drive a probe in the dual-probe mechanism to move to a position of a detection point of a material that is to be tested;
in response to the probe contacting the detection point, collect measurement data of the detection point through the detection mechanism;
determine whether the material is an unqualified material according to the measurement data and preset standard information;
and
in response to the material being determined to be the unqualified material, obtain abnormal data from the measurement data.

2 more elements

A non-transitory storage medium, being stored with an automatic testing program, which when executed by a processor, causing the processor to perform an automatic test method, wherein the automatic test method comprises:

controlling the driving mechanism to drive a probe in the dual-probe mechanism to move to a position of a detection point of a material that is to be tested;
in response to the probe contacting the detection point, collecting measurement data of the detection point through the detection mechanism;
determining whether the material is an unqualified material according to the measurement data and preset standard information;
and
in response to the material being determined to be the unqualified material, obtaining abnormal data from the measurement data.

2 more elements

Dependencies are inferred from the claim text.

Automatic test method, automatic test device, and storage medium

Life of this patent

Automatic test method, automatic test device, and storage medium

Life of this patent

Abstract

Claims20