Methods for determining remaining useful life in electronic devices and systems (rulas)

Abstract

Specific algorithmic methods are disclosed herein whereby the accumulated degradation or Remaining Useful Life (RUL) of an electrical semiconductor-based device or subsystem may be determined based on examining unintended RF emissions from the device or a subsystem while it is operating on a periodic, sporadic, or one-time basis. The methods may be then preferably combined to provide an accurate assessment and prediction of degree of its degradation or RUL. These assessments or predictions may be practical for more accurately allocating maintenance or replacement practices, especially for safety-critical systems. These assessments or predictions may be presented in an understandable, useful, comprehensive, more definitive, more detailed, or alternatively simpler format depending on the user's needs.

Dependencies are inferred from the claim text.