Domain-adapted multimodal large language models based on tensor build for calibration and measurement
AssigneeTektronix, Inc.
InventorsKan Tan, John J. Pickerd
Life of this patent
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AssigneeTektronix, Inc.
InventorsKan Tan, John J. Pickerd
Estimating the term…
A test and measurement instrument includes a port to allow the test and measurement instrument to connect to a device under test (DUT) to receive signals from the DUT, one or more analog-to-digital converters (ADCs) to receive a signal from the DUT and convert the signal to one or more digital waveforms, a user interface to allow a user to enter a query, and one or more processors configured to execute code that causes the one or more processors to: build one or more images of the one or more digital waveforms from the one or more ADCs, send the one or more images to a domain-adapted multimodal large language model (MLLM), receive parameters from the domain-adapted MLLM, provide the user with parameters for the DUT in response to the query, and apply the parameters to the DUT.
A test and measurement instrument, comprising:
A method, comprising:
Dependencies are inferred from the claim text.