Apparatus and method for inspecting a slit on a cap

Abstract

An apparatus for inspecting a slit made on a lateral surface of a plastic cap includes: a conveyor for transporting the cap along a path; an illuminator, configured to illuminate the lateral surface of the cap placed at an inspection position, wherein the cap, at the inspection position, is aligned with an inspection axis, the inspection axis being oriented vertically and transversely to the path; a plurality of cameras surrounding the inspection axis and configured to capture image data representing a plurality of images of the lateral surface of the cap at the inspection position; a control unit, configured to receive the image data and process them to derive therefrom information relating to the slit, the apparatus being characterized in that the illuminator includes a side wall extending around the inspection axis to illuminate all of the lateral surface of the cap with rays that converge towards the inspection axis, the side wall delimiting an internal space and including an inlet opening and an outlet opening to allow for passage of the cap into and out of the internal space, respectively.

Dependencies are inferred from the claim text.