Interferometric measurement method and interferometric measurement apparatus
AssigneeHamamatsu Photonics K.K.
InventorsHisanari TAKAHASHI, Ginji SUGIURA, Hiroshi SATOZONO, Naoya KAWAI
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AssigneeHamamatsu Photonics K.K.
InventorsHisanari TAKAHASHI, Ginji SUGIURA, Hiroshi SATOZONO, Naoya KAWAI
Estimating the term…
An interferometric measurement method using an interferometric measurement apparatus includes a first step of acquiring a first interference waveform in a first state by changing an optical path length difference between a first optical path and a second optical path in the first state in which a sample is not disposed in the second optical path, a second step of converting the first interference waveform into a first electric field amplitude waveform, a third step of acquiring a second interference waveform in a second state by changing the optical path length difference in the second state in which the sample is disposed in the second optical path, a fourth step of converting the second interference waveform into a second electric field amplitude waveform, and a fifth step of acquiring a physical property of the sample based on the peak amplitudes of the first and second electric field amplitude waveforms.
An interferometric measurement method using an interferometric measurement apparatus,
An interferometric measurement apparatus comprising:
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