Semiconductor device and manufacturing method thereof
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorHung-Te Lin
Life of this patent
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Abstract
A semiconductor device includes a semiconductor substrate including a first side, a second side, a sidewall connected to the first and second sides, and at least one protrusion protruded from the second side, devices disposed at the first side of the semiconductor substrate, and an interconnect structure disposed over the first side of the semiconductor substrate and electrically coupled to the devices. The protrusion and the semiconductor substrate are made of a same material
Claims20
A semiconductor device, comprising:
- a semiconductor substrate comprising a first side, a second side, a sidewall connected to the first and second sides, and at least one protrusion protruded from the second side, wherein the at least one protrusion and the semiconductor substrate are made of a same material;
- devices disposed at the first side of the semiconductor substrate;
- and
- an interconnect structure disposed over the first side of the semiconductor substrate and electrically coupled to the devices.
A semiconductor device, comprising:
- a semiconductor substrate comprising a first element and a second element, wherein a first atomic ratio of the second element to the first element near an active side of the semiconductor substrate is less than a second atomic ratio of the second element to the first element near a back side of the semiconductor substrate;
- devices disposed at the active side of the semiconductor substrate;
- and
- an interconnect structure disposed over the active side of the semiconductor substrate and electrically coupled to the devices.
A manufacturing method for a semiconductor device, comprising:
- forming an insulating region inside a semiconductor substrate, wherein the insulating region extends along a first direction, and the semiconductor substrate comprises device regions and a sacrificial region surrounding the device regions;
- forming an insulating via in the sacrificial region of the semiconductor substrate and connected to the insulating region, wherein the insulating via extends along a second direction substantially perpendicular to the first direction;
- forming devices and an interconnect structure over the semiconductor substrate and in the device regions, wherein the interconnect structure is electrically coupled to the devices;
- forming a window in the sacrificial region of the semiconductor substrate to expose the insulating via;
- removing the insulating via and the insulating region through the window;
- and
- separating the device regions from one another.
Dependencies are inferred from the claim text.