Test structure
AssigneeWinbond Electronics Corp.
InventorsShih-Ming Wang, Jun-Jie Pang
Life of this patent
Estimating the term…
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AssigneeWinbond Electronics Corp.
InventorsShih-Ming Wang, Jun-Jie Pang
Estimating the term…
A test structure including the following members is provided. A substrate includes an array region and a peripheral region. The array region has a first side and a second side opposite to each other. An isolation structure is located in the substrate. The isolation structure defines active regions in the substrate of the array region. Word lines pass through the active regions and are insulated from the substrate. The word lines include first word lines and second word lines arranged alternately. First contacts are electrically connected to the first word lines. Second contacts are electrically connected to the second word lines. The first contacts and the second contacts are arranged in a staggered manner. First conductive lines are electrically connected to the first contacts. Second conductive lines are electrically connected to the second contacts. The second conductive lines are extended from the peripheral region into the array region.
A test structure, comprising:
A test structure, comprising:
Dependencies are inferred from the claim text.