Background dac error calibration for sar adcs
AssigneeAnalog Devices, Inc.
InventorsEfram Burlingame, Enrique Alvarez-Fontecilla
Life of this patent
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AssigneeAnalog Devices, Inc.
InventorsEfram Burlingame, Enrique Alvarez-Fontecilla
Estimating the term…
An analog-to-digital converter (ADC) includes bit trial circuitry configured to perform ADC bit trials that compare an input signal to states of weighted circuit elements, a dither digital-to-analog converter (DAC) to receive a dither sequence and apply a dither signal to the bit trial circuitry, and calibration circuitry. The calibration circuitry is configured to input a dither sequence into the ADC bit trials as dithered bit trials; determine an effect of the dither sequence on results of the dithered bit trials; and update correction factors used to adjust results of the ADC bit trials using the determined effect of the dither sequence.
An analog-to-digital converter (ADC) comprising:
A method of calibration of an analog-to-digital converter (ADC), the method comprising:
A non-transitory computer readable storage medium including instructions, that when performed using a controller for calibration circuitry of an analog-to-digital converter (ADC) cause the calibration circuitry to perform acts comprising:
Dependencies are inferred from the claim text.