Cross-temperature range management in memory systems
AssigneeMicron Technology, Inc.
InventorsDionisio Minopoli, Ting Luo, Luca Porzio, Giuseppe Ferrari
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AssigneeMicron Technology, Inc.
InventorsDionisio Minopoli, Ting Luo, Luca Porzio, Giuseppe Ferrari
Estimating the term…
Methods, systems, and devices for cross-temperature range management in memory systems are described. One or more parameter values defining an expected temperature range may be indicated to and stored at a memory system, where the memory system may define a safe temperature range and one or more additional temperature ranges using the one or more parameter values. After entering the safe temperature range, the memory system may refresh one or more memory cells of one or more memory devices for which write operations were performed outside of the safe temperature range. By defining safe temperatures for operation using an expected operating range, the memory system may reduce a quantity and frequency of refresh operations and may increase a performance and quality of service (QOS), while reducing latency in operations and communications. Further, endurance and device lifetime may be increased by reducing a quantity of refresh operations.
A memory system, comprising:
A non-transitory computer-readable medium storing code comprising instructions which, when executed by processing circuitry of a memory system, cause the memory system to:
A method by a memory system, comprising:
Dependencies are inferred from the claim text.