Height measurement apparatus and height measurement method
AssigneeHamamatsu Photonics K.K.
InventorsTomonori NAKAMURA, Kunihiko TSUCHIYA
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AssigneeHamamatsu Photonics K.K.
InventorsTomonori NAKAMURA, Kunihiko TSUCHIYA
Estimating the term…
A height measurement apparatus includes: a light irradiation unit that irradiates a sample with irradiation light; a camera system that detects light from the sample irradiated with the irradiation light, and a control apparatus that calculates a height of the sample based on the wavelength information. The camera system includes an inclined dichroic mirror of which a transmittance and a reflectance change according to a wavelength in a predetermined wavelength range and which separates the light from the sample by transmitting and reflecting the light, a light detector that detects a reflected light quantity from light reflected by the inclined dichroic mirror, a light detector that detects a transmitted light quantity from light transmitted through the inclined dichroic mirror, and a processing unit that calculates the wavelength information based on a ratio between the reflected light quantity and the transmitted light quantity, to output the wavelength information.
A height measurement apparatus comprising:
A height measurement method comprising:
Dependencies are inferred from the claim text.